Test pattern generators using BDD and MTBDD

• Main Authors: Yuan-Jie Chen, 陳淵傑
• Other Authors: Chung-Len Lee
• Format: Others
• Language: en_US
• Published: 1994
• Online Access: http://ndltd.ncl.edu.tw/handle/13010801424224686794

碩士 === 國立交通大學 === 電子研究所 === 82 === In this thesis, we use the Binary Decision Diagram (BDD) and Multiple Terminated Binary Decision Diagram (MTBDD) to generate the test patterns for combinational circuits. This approach is very efficient to generate tests for the hard-to- detected faults and to identify redundant faults. During the test generation for a target fault in this method, there are many paths which do not activate the fault, an N signal in MTBDD is proposed to mask these paths to reduce the complexity of the BDD operations when propagating the faulty effect toward POs. Experimental results show that this strategy is very efficient for those faults to reduce computation which the N signals are in the higher order of the MTBDD tree.