Test pattern generators using BDD and MTBDD
碩士 === 國立交通大學 === 電子研究所 === 82 === In this thesis, we use the Binary Decision Diagram (BDD) and Multiple Terminated Binary Decision Diagram (MTBDD) to generate the test patterns for combinational circuits. This approach is very efficient...
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| Format: | Others |
| Language: | en_US |
| Published: |
1994
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| Online Access: | http://ndltd.ncl.edu.tw/handle/13010801424224686794 |
| Summary: | 碩士 === 國立交通大學 === 電子研究所 === 82 === In this thesis, we use the Binary Decision Diagram (BDD) and
Multiple Terminated Binary Decision Diagram (MTBDD) to
generate the test patterns for combinational circuits. This
approach is very efficient to generate tests for the hard-to-
detected faults and to identify redundant faults. During the
test generation for a target fault in this method, there are
many paths which do not activate the fault, an N signal in
MTBDD is proposed to mask these paths to reduce the
complexity of the BDD operations when propagating the faulty
effect toward POs. Experimental results show that this
strategy is very efficient for those faults to reduce
computation which the N signals are in the higher order of the
MTBDD tree.
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