Trademark Image Recognition Using Statistical and Shape Features

碩士 === 國立交通大學 === 資訊科學學系 === 82 === The goal of trademark examination is to reject infringement cases when trademarks are registered for patents. In order to simplify and speed up the trademark examination process, the development of a trad...

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Bibliographic Details
Main Authors: Wei-Chen Lu, 呂威震
Other Authors: Wen-Hsiang Tsai
Format: Others
Language:en_US
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/79595325120652398619
Description
Summary:碩士 === 國立交通大學 === 資訊科學學系 === 82 === The goal of trademark examination is to reject infringement cases when trademarks are registered for patents. In order to simplify and speed up the trademark examination process, the development of a trademark image recognition system is desired. A new approach to trademark image recognition is proposed. The basic idea is to extract features from the input trademark image, and to search similar trademarks in a feature database. The proposed system provides friendly interactive interfacing to perform the preprocessing and the feature extraction works. Appropriate shape features of the trademark images are utilized to perform preclassification. Detailed matching is performed next according to the combination of the statistical and shape features. Trademark graphics are of very great variety. Due to the subjective judgment on trademark examination and the difficulty of this task, only semi-automatic processing is implemented in this study. Several experimental results show the feasibility and practicability of the proposed approach.