Correlative Testing Analysis with Optimized Design of Active and Window Layer in n:AlGaAs/p:GaAs/p:AlGaAs Double Heterojunction Structure of IREDs

Correlative Testing Analysis with Optimized Design of Active and Window Layer in n:AlGaAs/p:GaAs/p:AlGaAs Double Heterojunction Structure of IREDs

碩士 === 中原大學 === 電子工程學系 === 82 ===

Bibliographic Details
Main Authors:	Chang,Po Ching, 張伯青
Other Authors:	Liao, Sen Mao
Format:	Others
Language:	zh-TW
Published:	1994
Online Access:	http://ndltd.ncl.edu.tw/handle/34526693031414291089

Internet

http://ndltd.ncl.edu.tw/handle/34526693031414291089