A Study on Japan''s Patent Examination System
碩士 === 淡江大學 === 日本研究所 === 81 === Patent system plays an important role in Japan''s Industrial development and technology advancement. Now Japan is a top country in Patent world .The Japanese Patent Office receives more than forty perc...
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ndltd-TW-081TKU000780012016-02-10T04:08:48Z http://ndltd.ncl.edu.tw/handle/22853191234362963896 A Study on Japan''s Patent Examination System 日本發明專利審查制度研究 Liu Shyue-Yuan 劉學源 碩士 淡江大學 日本研究所 81 Patent system plays an important role in Japan''s Industrial development and technology advancement. Now Japan is a top country in Patent world .The Japanese Patent Office receives more than forty percent of all the applications in the world annully . Japan''s Patent system can divided roughly into two parts : grant of patent right and protection of patent right. The former includes patent application , patent examination, patent decision and patent registration ,all of these are administrative dispositions of Paten Offices. The later is mainly concerns patent infringement and are judge by court as to enforce the protection of patent right . This thesis deals with the former part of Japan'' s Patent system . There are eight chapters in this thesis : Chapter 1 explains the purpose and practice of Japan''s patent system. Chapter 2 deals mainly in analysis patentability of invention . Chapter 3 talks about the right of inventer and employee''s invention . Chaper 4 will be focused on the procedure of patent application . The contents include patent application , formality examination , amendment , special applications and domestic priority right . Chapter 5 talks about the procedure of patent examination , mainly on laying open of application , request for examination , publication of application and opposition to the grant of patent. Chapter 6 discusses on trial ,retrial and interpretation . Chapter 7 , a discussion about patent litigation . Chapter 8 ,the conclusion of this thesis. Jen Eau-Tin 任耀廷 1993 學位論文 ; thesis 255 zh-TW |
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碩士 === 淡江大學 === 日本研究所 === 81 === Patent system plays an important role in Japan''s Industrial
development and technology advancement. Now Japan is a top
country in Patent world .The Japanese Patent Office receives
more than forty percent of all the applications in the
world annully . Japan''s Patent system can divided roughly
into two parts : grant of patent right and protection of
patent right. The former includes patent application , patent
examination, patent decision and patent registration ,all
of these are administrative dispositions of Paten
Offices. The later is mainly concerns patent infringement
and are judge by court as to enforce the protection of
patent right . This thesis deals with the former part of Japan''
s Patent system . There are eight chapters in this thesis :
Chapter 1 explains the purpose and practice of Japan''s patent
system. Chapter 2 deals mainly in analysis patentability
of invention . Chapter 3 talks about the right of
inventer and employee''s invention . Chaper 4 will be focused
on the procedure of patent application . The contents include
patent application , formality examination , amendment ,
special applications and domestic priority right . Chapter 5
talks about the procedure of patent examination , mainly
on laying open of application , request for examination
, publication of application and opposition to the grant
of patent. Chapter 6 discusses on trial ,retrial and
interpretation . Chapter 7 , a discussion about patent
litigation . Chapter 8 ,the conclusion of this thesis.
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author2 |
Jen Eau-Tin |
author_facet |
Jen Eau-Tin Liu Shyue-Yuan 劉學源 |
author |
Liu Shyue-Yuan 劉學源 |
spellingShingle |
Liu Shyue-Yuan 劉學源 A Study on Japan''s Patent Examination System |
author_sort |
Liu Shyue-Yuan |
title |
A Study on Japan''s Patent Examination System |
title_short |
A Study on Japan''s Patent Examination System |
title_full |
A Study on Japan''s Patent Examination System |
title_fullStr |
A Study on Japan''s Patent Examination System |
title_full_unstemmed |
A Study on Japan''s Patent Examination System |
title_sort |
study on japan''s patent examination system |
publishDate |
1993 |
url |
http://ndltd.ncl.edu.tw/handle/22853191234362963896 |
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