The Erase Degradation Measurement of flash EPROM by Charge Pumping Technique
碩士 === 國立清華大學 === 電機工程研究所 === 81 === A charge pumping technique has been used to explore the degradation of the flash EPROM cell due to the erase. Although the Fowler-Nordheim tunneling is employed for the erase, it is found that the band-t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1993
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| Online Access: | http://ndltd.ncl.edu.tw/handle/86334712278549968265 |