Design and Analysis of Self-Dual Multipliers

碩士 === 國立清華大學 === 電機工程研究所 === 81 === We present the theoretical foundations and universal ap- proach for design for testability and design for test compa- ctibility on path delay faults. Simple tests and modified c- ube distance are introdu...

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Bibliographic Details
Main Authors: Jia-Pei Shen, 沈嘉珮
Other Authors: Cheng-Wen Wu
Format: Others
Language:zh-TW
Published: 1993
Online Access:http://ndltd.ncl.edu.tw/handle/86823411056932041464