Test pattern generation and partial scan design for sequential circuits

Test pattern generation and partial scan design for sequential circuits

博士 === 國立成功大學 === 電機工程研究所 === 81 ===

Bibliographic Details
Main Authors: CHEN, BAO-CHUAN, 陳保川
Other Authors: JIANG, YU-SHENG
Format: Others
Language:en_US
Published: 1993
Online Access:http://ndltd.ncl.edu.tw/handle/59715564657336398614
id ndltd-TW-081NCKU2442002
record_format oai_dc
spelling ndltd-TW-081NCKU24420022016-07-20T04:11:36Z http://ndltd.ncl.edu.tw/handle/59715564657336398614 Test pattern generation and partial scan design for sequential circuits 序向電路測試樣本產生與部份掃描設計之研究 CHEN, BAO-CHUAN 陳保川 博士 國立成功大學 電機工程研究所 81 JIANG, YU-SHENG 劉濱達 王駿發 1993 學位論文 ; thesis 87 en_US
collection NDLTD
language en_US
format Others
sources NDLTD
description 博士 === 國立成功大學 === 電機工程研究所 === 81 ===
author2 JIANG, YU-SHENG
author_facet JIANG, YU-SHENG
CHEN, BAO-CHUAN
陳保川
author CHEN, BAO-CHUAN
陳保川
spellingShingle CHEN, BAO-CHUAN
陳保川
Test pattern generation and partial scan design for sequential circuits
author_sort CHEN, BAO-CHUAN
title Test pattern generation and partial scan design for sequential circuits
title_short Test pattern generation and partial scan design for sequential circuits
title_full Test pattern generation and partial scan design for sequential circuits
title_fullStr Test pattern generation and partial scan design for sequential circuits
title_full_unstemmed Test pattern generation and partial scan design for sequential circuits
title_sort test pattern generation and partial scan design for sequential circuits
publishDate 1993
url http://ndltd.ncl.edu.tw/handle/59715564657336398614
work_keys_str_mv AT chenbaochuan testpatterngenerationandpartialscandesignforsequentialcircuits
AT chénbǎochuān testpatterngenerationandpartialscandesignforsequentialcircuits
AT chenbaochuan xùxiàngdiànlùcèshìyàngběnchǎnshēngyǔbùfènsǎomiáoshèjìzhīyánjiū
AT chénbǎochuān xùxiàngdiànlùcèshìyàngběnchǎnshēngyǔbùfènsǎomiáoshèjìzhīyánjiū
_version_ 1718354331598585856

Similar Items