Test pattern generation and partial scan design for sequential circuits

Test pattern generation and partial scan design for sequential circuits

博士 === 國立成功大學 === 電機工程研究所 === 81 ===

Bibliographic Details
Main Authors:	CHEN, BAO-CHUAN, 陳保川
Other Authors:	JIANG, YU-SHENG
Format:	Others
Language:	en_US
Published:	1993
Online Access:	http://ndltd.ncl.edu.tw/handle/59715564657336398614

Description
Summary:	博士 === 國立成功大學 === 電機工程研究所 === 81 ===