Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy

博士 === 國立交通大學 === 電子研究所 === 80 ===

Bibliographic Details
Main Authors:	Liu, Tang-Jie, 劉堂傑
Other Authors:	Li, Jian-Ping
Format:	Others
Language:	zh-TW
Published:	1992
Online Access:	http://ndltd.ncl.edu.tw/handle/41680967434197594782

id	ndltd-TW-080NCTU4430023
record_format	oai_dc
spelling	ndltd-TW-080NCTU44300232015-10-13T14:20:24Z http://ndltd.ncl.edu.tw/handle/41680967434197594782 Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy 由分子束磊晶技術成長三五族化合物半導體之原子層摻雜結構的特性量測與分析 Liu, Tang-Jie 劉堂傑博士國立交通大學電子研究所 80 Li, Jian-Ping 李建平 1992 學位論文 ; thesis 170 zh-TW
collection	NDLTD
language	zh-TW
format	Others
sources	NDLTD
description	博士 === 國立交通大學 === 電子研究所 === 80 ===
author2	Li, Jian-Ping
author_facet	Li, Jian-Ping Liu, Tang-Jie 劉堂傑
author	Liu, Tang-Jie 劉堂傑
spellingShingle	Liu, Tang-Jie 劉堂傑 Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy
author_sort	Liu, Tang-Jie
title	Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy
title_short	Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy
title_full	Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy
title_fullStr	Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy
title_full_unstemmed	Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy
title_sort	characterization and analysis of delta-doped (atomic-plane-doped) structures in iii-v compound semiconductors grown by molecular beam epitaxy
publishDate	1992
url	http://ndltd.ncl.edu.tw/handle/41680967434197594782
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Characterization and analysis of delta-doped (atomic-plane-doped) structures in III-V compound semiconductors grown by molecular beam epitaxy

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