Sequential test generation
碩士 === 國立臺灣大學 === 電機工程研究所 === 79 ===
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1991
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Online Access: | http://ndltd.ncl.edu.tw/handle/46517409668428702051 |
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ndltd-TW-079NTU024421212016-02-15T04:13:26Z http://ndltd.ncl.edu.tw/handle/46517409668428702051 Sequential test generation 循序電路自動測試樣本產生系統 潘志得 碩士 國立臺灣大學 電機工程研究所 79 FENG, WU-XIONG 林呈祥 1991 學位論文 ; thesis 0 zh-TW |
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zh-TW |
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Others
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碩士 === 國立臺灣大學 === 電機工程研究所 === 79 ===
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author2 |
FENG, WU-XIONG |
author_facet |
FENG, WU-XIONG 潘志得 |
author |
潘志得 |
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潘志得 Sequential test generation |
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潘志得 |
title |
Sequential test generation |
title_short |
Sequential test generation |
title_full |
Sequential test generation |
title_fullStr |
Sequential test generation |
title_full_unstemmed |
Sequential test generation |
title_sort |
sequential test generation |
publishDate |
1991 |
url |
http://ndltd.ncl.edu.tw/handle/46517409668428702051 |
work_keys_str_mv |
AT pānzhìdé sequentialtestgeneration AT pānzhìdé xúnxùdiànlùzìdòngcèshìyàngběnchǎnshēngxìtǒng |
_version_ |
1718188970600300544 |