The state diagram verification and test response compression for sequential circuits

碩士 === 國立成功大學 === 電機工程研究所 === 78 ===

Bibliographic Details
Main Authors: LIU,SHI-YUN, 劉世運
Other Authors: WANG,JUN-FA
Format: Others
Language:zh-TW
Published: 1990
Online Access:http://ndltd.ncl.edu.tw/handle/67369958929543874144
Description
Summary:碩士 === 國立成功大學 === 電機工程研究所 === 78 ===