Measuring the lattice temperature of a-Si by laser induced fluorescence method

Measuring the lattice temperature of a-Si by laser induced fluorescence method

碩士 === 國立臺灣大學 === 電機工程研究所 === 75 ===

Bibliographic Details
Main Authors:	HE, SHI-REN, 何世仁
Other Authors:	MENG, XIAN-YU
Format:	Others
Language:	zh-TW
Published:	1987
Online Access:	http://ndltd.ncl.edu.tw/handle/02868945165361799631

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