Measuring the lattice temperature of a-Si by laser induced fluorescence method

碩士 === 國立臺灣大學 === 電機工程研究所 === 75 ===

Bibliographic Details
Main Authors:	HE, SHI-REN, 何世仁
Other Authors:	MENG, XIAN-YU
Format:	Others
Language:	zh-TW
Published:	1987
Online Access:	http://ndltd.ncl.edu.tw/handle/02868945165361799631

id	ndltd-TW-075NTU02442040
record_format	oai_dc
spelling	ndltd-TW-075NTU024420402016-02-12T04:10:42Z http://ndltd.ncl.edu.tw/handle/02868945165361799631 Measuring the lattice temperature of a-Si by laser induced fluorescence method 利用雷射共振瑩光法測量矽晶格之溫度 HE, SHI-REN 何世仁碩士國立臺灣大學電機工程研究所 75 MENG, XIAN-YU 孟憲鈺 1987 學位論文 ; thesis 0 zh-TW
collection	NDLTD
language	zh-TW
format	Others
sources	NDLTD
description	碩士 === 國立臺灣大學 === 電機工程研究所 === 75 ===
author2	MENG, XIAN-YU
author_facet	MENG, XIAN-YU HE, SHI-REN 何世仁
author	HE, SHI-REN 何世仁
spellingShingle	HE, SHI-REN 何世仁 Measuring the lattice temperature of a-Si by laser induced fluorescence method
author_sort	HE, SHI-REN
title	Measuring the lattice temperature of a-Si by laser induced fluorescence method
title_short	Measuring the lattice temperature of a-Si by laser induced fluorescence method
title_full	Measuring the lattice temperature of a-Si by laser induced fluorescence method
title_fullStr	Measuring the lattice temperature of a-Si by laser induced fluorescence method
title_full_unstemmed	Measuring the lattice temperature of a-Si by laser induced fluorescence method
title_sort	measuring the lattice temperature of a-si by laser induced fluorescence method
publishDate	1987
url	http://ndltd.ncl.edu.tw/handle/02868945165361799631
work_keys_str_mv	AT heshiren measuringthelatticetemperatureofasibylaserinducedfluorescencemethod AT héshìrén measuringthelatticetemperatureofasibylaserinducedfluorescencemethod AT heshiren lìyòngléishègòngzhènyíngguāngfǎcèliàngxìjīnggézhīwēndù AT héshìrén lìyòngléishègòngzhènyíngguāngfǎcèliàngxìjīnggézhīwēndù
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Measuring the lattice temperature of a-Si by laser induced fluorescence method

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