The reliability test and its statistical study on the bipolar junction transistors

碩士 === 國立臺灣科技大學 === 工程技術研究所 === 74 ===

Bibliographic Details
Main Author: 李蔚
Other Authors: Xiao, Shui-Yin
Format: Others
Language:zh-TW
Published: 1986
Online Access:http://ndltd.ncl.edu.tw/handle/26141164987463693555