The reliability test and its statistical study on the bipolar junction transistors
碩士 === 國立臺灣科技大學 === 工程技術研究所 === 74 ===
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| Format: | Others |
| Language: | zh-TW |
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1986
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26141164987463693555 |
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ndltd-TW-074NTUS2027041 |
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ndltd-TW-074NTUS20270412016-07-22T04:08:54Z http://ndltd.ncl.edu.tw/handle/26141164987463693555 The reliability test and its statistical study on the bipolar junction transistors 雙極性電晶體之可靠度試驗及其統計研究 李蔚 碩士 國立臺灣科技大學 工程技術研究所 74 Xiao, Shui-Yin 劉政光 1986 學位論文 ; thesis 0 zh-TW |
| collection |
NDLTD |
| language |
zh-TW |
| format |
Others
|
| sources |
NDLTD |
| description |
碩士 === 國立臺灣科技大學 === 工程技術研究所 === 74 ===
|
| author2 |
Xiao, Shui-Yin |
| author_facet |
Xiao, Shui-Yin 李蔚 |
| author |
李蔚 |
| spellingShingle |
李蔚 The reliability test and its statistical study on the bipolar junction transistors |
| author_sort |
李蔚 |
| title |
The reliability test and its statistical study on the bipolar junction transistors |
| title_short |
The reliability test and its statistical study on the bipolar junction transistors |
| title_full |
The reliability test and its statistical study on the bipolar junction transistors |
| title_fullStr |
The reliability test and its statistical study on the bipolar junction transistors |
| title_full_unstemmed |
The reliability test and its statistical study on the bipolar junction transistors |
| title_sort |
reliability test and its statistical study on the bipolar junction transistors |
| publishDate |
1986 |
| url |
http://ndltd.ncl.edu.tw/handle/26141164987463693555 |
| work_keys_str_mv |
AT lǐwèi thereliabilitytestanditsstatisticalstudyonthebipolarjunctiontransistors AT lǐwèi shuāngjíxìngdiànjīngtǐzhīkěkàodùshìyànjíqítǒngjìyánjiū AT lǐwèi reliabilitytestanditsstatisticalstudyonthebipolarjunctiontransistors |
| _version_ |
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