Analysis of Frozen Desserts Using Low-Temperature Scanning Electron Microscopy (LT-SEM)
<p> Commercial vanilla ice cream and other frozen desserts from the United States were analyzed for ice crystal length using low-temperature scanning electron microscopy (LT-SEM). Average ice crystal length was determined using multiple micrographs of each sample/product. Out of the products t...
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| Language: | EN |
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Clemson University
2019
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| Online Access: | http://pqdtopen.proquest.com/#viewpdf?dispub=10982077 |