Non-Contact Probes for Characterization of THz Devices and Components

Non-Contact Probes for Characterization of THz Devices and Components

Bibliographic Details
Main Author: Larsen, Mads Jacob Hedegaard
Language:English
Published: Wright State University / OhioLINK 2013
Subjects:
Electrical Engineering
Engineering
Energy
Radiation
THz
Terahertz
Non-contact probes
Probes
Characterization
Devices
Components
submillimeter
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=wright1369393504
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spelling ndltd-OhioLink-oai-etd.ohiolink.edu-wright13693935042021-08-03T05:23:42Z Non-Contact Probes for Characterization of THz Devices and Components Larsen, Mads Jacob Hedegaard Electrical Engineering Engineering Energy Radiation THz Terahertz Non-contact probes Probes Characterization Devices Components submillimeter One of the challenges in developing semiconductor devices and integrated circuits for the terahertz (THz) region is their electrical characterization. The most common technology for their characterization is presently metal-to-metal, DC-coupled contact probes, which operate up to 750 GHz but are expensive and fragile.In this Master’s Thesis, we investigate through numerical simulation and analysis the electromagnetic properties of a novel, AC-coupled probe. The new probe couples radiation from the device or circuit-under-test (DUT) via polarization current, which is then transformed to conduction current in the probe and down-converted in frequency to baseband by an optically-pumped photomixer. Finite-element simulations using High Frequency Structure Simulator (HFSS) yield an optimum narrowband designs for probing devices and circuits in coplanar waveguide (CPW), with DUT-to-photomixer coupling efficiencies between -10 and -20 dB between 300 and 600 GHz. A broadband designs shows promising performance up to 1300 GHz in an operating band of 1000 GHz. 2013-05-28 English text Wright State University / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=wright1369393504 http://rave.ohiolink.edu/etdc/view?acc_num=wright1369393504 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.
collection NDLTD
language English
sources NDLTD
topic Electrical Engineering
Engineering
Energy
Radiation
THz
Terahertz
Non-contact probes
Probes
Characterization
Devices
Components
submillimeter
spellingShingle Electrical Engineering
Engineering
Energy
Radiation
THz
Terahertz
Non-contact probes
Probes
Characterization
Devices
Components
submillimeter
Larsen, Mads Jacob Hedegaard
Non-Contact Probes for Characterization of THz Devices and Components
author Larsen, Mads Jacob Hedegaard
author_facet Larsen, Mads Jacob Hedegaard
author_sort Larsen, Mads Jacob Hedegaard
title Non-Contact Probes for Characterization of THz Devices and Components
title_short Non-Contact Probes for Characterization of THz Devices and Components
title_full Non-Contact Probes for Characterization of THz Devices and Components
title_fullStr Non-Contact Probes for Characterization of THz Devices and Components
title_full_unstemmed Non-Contact Probes for Characterization of THz Devices and Components
title_sort non-contact probes for characterization of thz devices and components
publisher Wright State University / OhioLINK
publishDate 2013
url http://rave.ohiolink.edu/etdc/view?acc_num=wright1369393504
work_keys_str_mv AT larsenmadsjacobhedegaard noncontactprobesforcharacterizationofthzdevicesandcomponents
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