AlGaN/GaN HEMT Topology Investigation Using Measured Data and Device Modeling

AlGaN/GaN HEMT Topology Investigation Using Measured Data and Device Modeling

Bibliographic Details
Main Author:	Langley, Derrick
Language:	English
Published:	Wright State University / OhioLINK 2007
Subjects:	AlGaN/GaN HEMT Transistor topology modeling
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=wright1177728294

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