Fault Modeling and Fault Type Distinguishing Test Methods for Digital Microfluidics Chips

Fault Modeling and Fault Type Distinguishing Test Methods for Digital Microfluidics Chips

Bibliographic Details
Main Author: Sun, Xinyu
Language:English
Published: University of Cincinnati / OhioLINK 2013
Subjects:
Computer Engineering
Fault modeling
Test methods
BIST
Digital microfluidics chip
Microfluidics EDA
March algorithm
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=ucin1380557053
Description
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