Robustness Issues of Run-time Leakage Control in Nano-scale Technologies

Robustness Issues of Run-time Leakage Control in Nano-scale Technologies

Bibliographic Details
Main Author: Shi, Danni
Language:English
Published: University of Cincinnati / OhioLINK 2010
Subjects:
Electrical Engineering
RBB
PG
ground bounce
wake up time
mode transition
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=ucin1282054251
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spelling ndltd-OhioLink-oai-etd.ohiolink.edu-ucin12820542512021-08-03T06:14:20Z Robustness Issues of Run-time Leakage Control in Nano-scale Technologies Shi, Danni Electrical Engineering RBB PG ground bounce wake up time mode transition As CMOS technology scales down, the substantially increased leakage power consumption has made leakage reduction techniques important in VLSI circuit design. Popular techniques such as reverse body bias (RBB) and power gating (PG) are used in current circuit design. However, transient circuit response during mode transitions, especially from sleep mode to active mode, has not been studied thoroughly. Most researchers only analyze the rush current in transition and consider no parasitic inductance. This thesis takes RBB as the target leakage reduction technique and analyzes the circuit response during mode transitions, including ground bounce magnitude and wake up time. An accurate circuit model has been developed where on-chip and package parasitic parameters are added to ensure accuracy. A fast simulation method using Matlab has been provided. The circuit behaviors are discussed in detail. To better understand the modeled circuit behaviors, circuits under RBB with their base connected to the global ground are also analyzed. Such connections cause a positive ground bounce. PG model has been developed to be compared with RBB technique. Finally several optimization methods are proposed to reduce the circuit wake up time. 2010-12-06 English text University of Cincinnati / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=ucin1282054251 http://rave.ohiolink.edu/etdc/view?acc_num=ucin1282054251 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.
collection NDLTD
language English
sources NDLTD
topic Electrical Engineering
RBB
PG
ground bounce
wake up time
mode transition
spellingShingle Electrical Engineering
RBB
PG
ground bounce
wake up time
mode transition
Shi, Danni
Robustness Issues of Run-time Leakage Control in Nano-scale Technologies
author Shi, Danni
author_facet Shi, Danni
author_sort Shi, Danni
title Robustness Issues of Run-time Leakage Control in Nano-scale Technologies
title_short Robustness Issues of Run-time Leakage Control in Nano-scale Technologies
title_full Robustness Issues of Run-time Leakage Control in Nano-scale Technologies
title_fullStr Robustness Issues of Run-time Leakage Control in Nano-scale Technologies
title_full_unstemmed Robustness Issues of Run-time Leakage Control in Nano-scale Technologies
title_sort robustness issues of run-time leakage control in nano-scale technologies
publisher University of Cincinnati / OhioLINK
publishDate 2010
url http://rave.ohiolink.edu/etdc/view?acc_num=ucin1282054251
work_keys_str_mv AT shidanni robustnessissuesofruntimeleakagecontrolinnanoscaletechnologies
_version_ 1719433230533263360

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