Nanoscale Characterization and Control of Native Point Defects in Metal Oxide Semiconductors and Device Structures

Nanoscale Characterization and Control of Native Point Defects in Metal Oxide Semiconductors and Device Structures

Bibliographic Details
Main Author:	Gao, Hantian
Language:	English
Published:	The Ohio State University / OhioLINK 2021
Subjects:	Condensed Matter Physics Materials Science Physics Solid State Physics Electrical Engineering Nanoscience Zinc Oxide Strontium Titanate Gallium Oixde Cathodoluminescence Dielectric Breakdown MBE SPS Native Point Defects Remote Plasma Neutron Irradiation Thermal Anneal Flash Sintering Surfaces and Interfaces
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu1618838504594148

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