Nanoscale Characterization and Control of Native Point Defects in Metal Oxide Semiconductors and Device Structures

Nanoscale Characterization and Control of Native Point Defects in Metal Oxide Semiconductors and Device Structures

Bibliographic Details
Main Author: Gao, Hantian
Language:English
Published: The Ohio State University / OhioLINK 2021
Subjects:
Condensed Matter Physics
Materials Science
Physics
Solid State Physics
Electrical Engineering
Nanoscience
Zinc Oxide
Strontium Titanate
Gallium Oixde
Cathodoluminescence
Dielectric Breakdown
MBE
SPS
Native Point Defects
Remote Plasma
Neutron Irradiation
Thermal Anneal
Flash Sintering
Surfaces and Interfaces
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1618838504594148
Description
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