Capacitance-Based Characterization of PIN Devices

Capacitance-Based Characterization of PIN Devices

Bibliographic Details
Main Author: Fink, Douglas Rudolph
Language:English
Published: The Ohio State University / OhioLINK 2020
Subjects:
Electrical Engineering
Semiconductors
photodiodes
p-i-n diodes
capacitance-voltage measurements
type-II superlattices
doping
dual junction analysis
molecular beam epitaxy
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1587463438933021

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1587463438933021

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