Scanning Probe Microscopy Measurements and Simulations of Traps and Schottky Barrier Heights of Gallium Nitride and Gallium Oxide

Scanning Probe Microscopy Measurements and Simulations of Traps and Schottky Barrier Heights of Gallium Nitride and Gallium Oxide

Bibliographic Details
Main Author: Galiano, Kevin
Language:English
Published: The Ohio State University / OhioLINK 2020
Subjects:
Physics
Scanning Probe Microscopy
Deep Level Transient Spectroscopy
SP-DLTS
Scanning Tunneling Microscopy
Ballistic Electron Emission Microscopy
Semiconductors
Materials Characterization
Finite Element Analysis
COMSOL Multiphysics Simulations
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1576715425331868

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1576715425331868

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