Multi-Attribute Design for Authentication and Reliability (MADAR)

Multi-Attribute Design for Authentication and Reliability (MADAR)

Bibliographic Details
Main Author: Casto, Matthew James
Language:English
Published: The Ohio State University / OhioLINK 2018
Subjects:
Electrical Engineering
Authentication
Unique ID
Hardware Security
Analog Mixed-Signal
Supply chain risk management
trusted electronics
digital to analog converter
Reliability
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1512009861557857
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spelling ndltd-OhioLink-oai-etd.ohiolink.edu-osu15120098615578572021-08-03T07:04:23Z Multi-Attribute Design for Authentication and Reliability (MADAR) Casto, Matthew James Electrical Engineering Authentication Unique ID Hardware Security Analog Mixed-Signal Supply chain risk management trusted electronics digital to analog converter Reliability Increased globalization of design, production, and independent distribution of integrated circuits (ICs) has provided adversarial and criminal opportunity for strategic, malicious, and monetary gain through counterfeiting, cloning, and tampering, producing a supply chain vulnerable to malicious or improper function and degraded reliability. Military, commercial avionics, medical, banking, and automotive systems rely on components providing high security, high reliability operation, and the impact can be large in terms of safety, readiness, mission success, and overall lifecycle cost when tampered parts find their way into the supply chain. Likewise, commodity platforms, such as the Internet of Things (IoT), rely on each networked component providing trustworthy authentication and identification, which has proven to be extremely vulnerable to cloning and spoofing when implemented through software or firmware solutions. Across these platforms, major effort has been focused on enhancing hardware assurance through intrinsic and unique physical hardware traits. Previous hardware authentication and identification techniques have targeted digital solutions that require increased logic overhead in order to obtain adequate uniqueness, have a limited number of implementation architectures, and suffer from significant environmental instabilities. In this work, the process-induced variation response of analog mixed-signal (AMS) circuits is investigated to yield foundational anti-counterfeiting, anti-cloning, design and characterization techniques. It explores unique behaviors termed Process Specific Functions (PSFs) to identify and group circuits of the same pedigree and provide traits for authentication, individual chip identification, and reliability monitoring. PSFs are demonstrated through the expansion of fundamental quantization sampling theory to produce a statistically bounded digital to analog converter model as implemented within a transmitter architecture. Simulation capabilities showed predictable circuit traits, including random process variations for authentication and unique ID. The model showed 90% Probability of Detection (PoD) with less than a 10% false alarm rate for an individual process specific cloning scenario, demonstrating foundational design capability for AMS counterfeit prevention and identification. The work makes significant progress towards quantifying design specific authentication behavior for the first time in analog ICs. A parameter space of harmonic amplitude responses is correlated to random and systematic process variations to produce challenge driven non-linear quantifiable and measurable distribution responses. These unique authenticity and reliability characteristics are related to physical process models in a low power 90nm CMOS, and are expanded for unique identification in a 130nm SiGe process technology. Collectively, this work provides an in-situ novel and foundational analog integrated circuit (IC) supply chain risk management (SCRM) and hardware security design framework. 2018-05-24 English text The Ohio State University / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=osu1512009861557857 http://rave.ohiolink.edu/etdc/view?acc_num=osu1512009861557857 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.
collection NDLTD
language English
sources NDLTD
topic Electrical Engineering
Authentication
Unique ID
Hardware Security
Analog Mixed-Signal
Supply chain risk management
trusted electronics
digital to analog converter
Reliability
spellingShingle Electrical Engineering
Authentication
Unique ID
Hardware Security
Analog Mixed-Signal
Supply chain risk management
trusted electronics
digital to analog converter
Reliability
Casto, Matthew James
Multi-Attribute Design for Authentication and Reliability (MADAR)
author Casto, Matthew James
author_facet Casto, Matthew James
author_sort Casto, Matthew James
title Multi-Attribute Design for Authentication and Reliability (MADAR)
title_short Multi-Attribute Design for Authentication and Reliability (MADAR)
title_full Multi-Attribute Design for Authentication and Reliability (MADAR)
title_fullStr Multi-Attribute Design for Authentication and Reliability (MADAR)
title_full_unstemmed Multi-Attribute Design for Authentication and Reliability (MADAR)
title_sort multi-attribute design for authentication and reliability (madar)
publisher The Ohio State University / OhioLINK
publishDate 2018
url http://rave.ohiolink.edu/etdc/view?acc_num=osu1512009861557857
work_keys_str_mv AT castomatthewjames multiattributedesignforauthenticationandreliabilitymadar
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