Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /

Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /

Bibliographic Details
Main Author:	Kaczer, Benjamin
Language:	English
Published:	The Ohio State University / OhioLINK 1998
Subjects:	Engineering
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu14879501536019

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