Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /

Bibliographic Details
Main Author:	Kaczer, Benjamin
Language:	English
Published:	The Ohio State University / OhioLINK 1998
Subjects:	Engineering
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu14879501536019

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spelling	ndltd-OhioLink-oai-etd.ohiolink.edu-osu148795015360192021-08-03T06:59:35Z Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy / Kaczer, Benjamin Engineering 1998 English text The Ohio State University / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=osu14879501536019 http://rave.ohiolink.edu/etdc/view?acc_num=osu14879501536019 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.
collection	NDLTD
language	English
sources	NDLTD
topic	Engineering
spellingShingle	Engineering Kaczer, Benjamin Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /
author	Kaczer, Benjamin
author_facet	Kaczer, Benjamin
author_sort	Kaczer, Benjamin
title	Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /
title_short	Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /
title_full	Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /
title_fullStr	Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /
title_full_unstemmed	Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /
title_sort	hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /
publisher	The Ohio State University / OhioLINK
publishDate	1998
url	http://rave.ohiolink.edu/etdc/view?acc_num=osu14879501536019
work_keys_str_mv	AT kaczerbenjamin hotelectroneffectsinthinsilicondioxidefilmsstudiedwithballisticelectronemissionmicroscopy
_version_	1719451071944851456

Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy /

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