Scanning tunneling microscopy study of oxide cluster nucleation and oxidation-induced etching on silicon surfaces /

Bibliographic Details
Main Author: Seiple, Jeffrey Vance
Language:English
Published: The Ohio State University / OhioLINK 1996
Subjects:
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1487942476406293
Description
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