The Development, Validity, and Reliability of Process, Product, and Gage Quality Control Plans/Indices used to Measure the Continuous Improvement of Manufacturing Processes /

Bibliographic Details
Main Author: Wetzel, David K.
Language:English
Published: The Ohio State University / OhioLINK 1995
Subjects:
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1487931512620227

Similar Items