The Development, Validity, and Reliability of Process, Product, and Gage Quality Control Plans/Indices used to Measure the Continuous Improvement of Manufacturing Processes /
Main Author: | Wetzel, David K. |
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Language: | English |
Published: |
The Ohio State University / OhioLINK
1995
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Subjects: | |
Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=osu1487931512620227 |
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