An investigation of nonideal process and device effects in fundamental CMOS analog subcircuits /

An investigation of nonideal process and device effects in fundamental CMOS analog subcircuits /

Bibliographic Details
Main Author:	Abel, Christopher J.
Language:	English
Published:	The Ohio State University / OhioLINK 1995
Subjects:	Engineering
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu1487865929454587

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