Effects of stress on the electrical characteristics of a tunnel diode /

Bibliographic Details
Main Author: Lee, Hsing-San
Language:English
Published: The Ohio State University / OhioLINK 1964
Subjects:
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1486564377844418
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spelling ndltd-OhioLink-oai-etd.ohiolink.edu-osu14865643778444182021-08-03T06:43:10Z Effects of stress on the electrical characteristics of a tunnel diode / Lee, Hsing-San Engineering Tunnel diodes 1964 English text The Ohio State University / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=osu1486564377844418 http://rave.ohiolink.edu/etdc/view?acc_num=osu1486564377844418 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.
collection NDLTD
language English
sources NDLTD
topic Engineering
Tunnel diodes
spellingShingle Engineering
Tunnel diodes
Lee, Hsing-San
Effects of stress on the electrical characteristics of a tunnel diode /
author Lee, Hsing-San
author_facet Lee, Hsing-San
author_sort Lee, Hsing-San
title Effects of stress on the electrical characteristics of a tunnel diode /
title_short Effects of stress on the electrical characteristics of a tunnel diode /
title_full Effects of stress on the electrical characteristics of a tunnel diode /
title_fullStr Effects of stress on the electrical characteristics of a tunnel diode /
title_full_unstemmed Effects of stress on the electrical characteristics of a tunnel diode /
title_sort effects of stress on the electrical characteristics of a tunnel diode /
publisher The Ohio State University / OhioLINK
publishDate 1964
url http://rave.ohiolink.edu/etdc/view?acc_num=osu1486564377844418
work_keys_str_mv AT leehsingsan effectsofstressontheelectricalcharacteristicsofatunneldiode
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