Metal contacts to silicon carbide and gallium nitride studied with ballistic electron emission microscopy /

Metal contacts to silicon carbide and gallium nitride studied with ballistic electron emission microscopy /

Bibliographic Details
Main Author:	Im, Hsung Jai
Language:	English
Published:	The Ohio State University / OhioLINK 2002
Subjects:	Physics Silicon carbide Gallium nitride Electrons
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu1486402957194756

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