Non-Contact Probes: A Novel Approach for On-Wafer Characterization of Millimeter-Wave and Sub-Millimeter-Wave Devices and Integrated Circuits

Bibliographic Details
Main Author: Caglayan, Cosan
Language:English
Published: The Ohio State University / OhioLINK 2016
Subjects:
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1461163685

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