Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides

Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides

Bibliographic Details
Main Author:	Zhang, Zhichun
Language:	English
Published:	The Ohio State University / OhioLINK 2013
Subjects:	Electrical Engineering Nanotechnology Nanoscience Solid State Physics Engineering Wide band gap semiconductor high-K dielectric Zinc oxide MoS2 depth-resolved cathodoluminescence spectroscopy surface photovoltage spectroscopy photoluminescence spectroscopy
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518

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