Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides

Process Dependence of Defects and Dopants in Wide Band Gap Semiconductor and Oxides

Bibliographic Details
Main Author: Zhang, Zhichun
Language:English
Published: The Ohio State University / OhioLINK 2013
Subjects:
Electrical Engineering
Nanotechnology
Nanoscience
Solid State Physics
Engineering
Wide band gap semiconductor
high-K dielectric
Zinc oxide
MoS2
depth-resolved cathodoluminescence spectroscopy
surface photovoltage spectroscopy
photoluminescence spectroscopy
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1366107518

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