Trapping Effects in AlGaN/GaN HEMTs for High Frequency Applications : Modeling and Characterization Using Large Signal Network Analyzer and Deep Level Optical Spectroscopy

Trapping Effects in AlGaN/GaN HEMTs for High Frequency Applications : Modeling and Characterization Using Large Signal Network Analyzer and Deep Level Optical Spectroscopy

Bibliographic Details
Main Author:	Yang, Chieh Kai
Language:	English
Published:	The Ohio State University / OhioLINK 2011
Subjects:	Electrical Engineering defect degradation large signal network analyzer optical spectroscopy
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=osu1310747425

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