Investigation of AlGaN films and nickel/AlGaN Schottky diodes using depth-dependent cathodoluminescence spectroscopy and secondary ion mass spectrometry

Investigation of AlGaN films and nickel/AlGaN Schottky diodes using depth-dependent cathodoluminescence spectroscopy and secondary ion mass spectrometry

Bibliographic Details
Main Author: Bradley, Shawn Todd
Language:English
Published: The Ohio State University / OhioLINK 2004
Subjects:
GaN
AlN
AlGaN
gallium nitride
nitride
LEEN
cathodoluminescence
CL
IPE
internal photoemission spectroscopy
secondary ion mass spectrometry
SIMS
Schottky
doping
HFET
HEMT
UHV
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1078329692

Internet

http://rave.ohiolink.edu/etdc/view?acc_num=osu1078329692

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