Metal Contacts to Silicon Carbide and Gallium Nitride Studied with Ballistic Electron Emission Microscopy

Bibliographic Details
Main Author: Im, Hsung J.
Language:English
Published: The Ohio State University / OhioLINK 2001
Subjects:
SBH
BHD
Online Access:http://rave.ohiolink.edu/etdc/view?acc_num=osu1000844302

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