Metal Contacts to Silicon Carbide and Gallium Nitride Studied with Ballistic Electron Emission Microscopy
Main Author: | Im, Hsung J. |
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Language: | English |
Published: |
The Ohio State University / OhioLINK
2001
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Subjects: | |
Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=osu1000844302 |
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