A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors

Bibliographic Details
Main Author:	Gao, Yong
Language:	English
Published:	Ohio University / OhioLINK 2017
Subjects:	Industrial Engineering burn-in degradation modeling degradation-based burn-in Gibbs sampling hierarchical Bayesian model Monte Carlo simulation reliability optimization warranty duration measurement errors two-phase degradation patterns light display devices
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013

id	ndltd-OhioLink-oai-etd.ohiolink.edu-ohiou1509109739168013
record_format	oai_dc
spelling	ndltd-OhioLink-oai-etd.ohiolink.edu-ohiou15091097391680132021-08-03T07:04:23Z A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors Gao, Yong Industrial Engineering burn-in degradation modeling degradation-based burn-in Gibbs sampling hierarchical Bayesian model Monte Carlo simulation reliability optimization warranty duration measurement errors two-phase degradation patterns light display devices This thesis proposes to plan a degradation-based burn-in test for light display devices with two-phase degradation patterns by using Bayesian approach. The main focus of the burn-in test concerned in this study is to eliminate the initial rapid degradation phase, and a hierarchical Bayesian bi-exponential model is proposed and applied to define the two-phase degradation patterns of the burn-in population. Measurement uncertainty is the main focus of the burn-in test. Measurement uncertainty is an important factor during degradation observation of the burn-in population. The expected degradation path cannot represent the same as the observed degradation path. Warranty duration can also affect the optimal burn decisions. Mission reliability and expected cost criterions are considered with the available pre-burn-in data of a plasma display panel (PDP) example. To make the optimal burn-in decision, a cost optimization (minimization) model is developed for this thesis. 2017 English text Ohio University / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013 http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.
collection	NDLTD
language	English
sources	NDLTD
topic	Industrial Engineering burn-in degradation modeling degradation-based burn-in Gibbs sampling hierarchical Bayesian model Monte Carlo simulation reliability optimization warranty duration measurement errors two-phase degradation patterns light display devices
spellingShingle	Industrial Engineering burn-in degradation modeling degradation-based burn-in Gibbs sampling hierarchical Bayesian model Monte Carlo simulation reliability optimization warranty duration measurement errors two-phase degradation patterns light display devices Gao, Yong A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors
author	Gao, Yong
author_facet	Gao, Yong
author_sort	Gao, Yong
title	A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors
title_short	A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors
title_full	A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors
title_fullStr	A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors
title_full_unstemmed	A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors
title_sort	degradation-based burn-in optimization for light display devices with two-phase degradation patterns considering warranty durations and measurement errors
publisher	Ohio University / OhioLINK
publishDate	2017
url	http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1509109739168013
work_keys_str_mv	AT gaoyong adegradationbasedburninoptimizationforlightdisplaydeviceswithtwophasedegradationpatternsconsideringwarrantydurationsandmeasurementerrors AT gaoyong degradationbasedburninoptimizationforlightdisplaydeviceswithtwophasedegradationpatternsconsideringwarrantydurationsandmeasurementerrors
_version_	1719453102607695872

A Degradation-based Burn-in Optimization for Light Display Devices with Two-phase Degradation Patterns considering Warranty Durations and Measurement Errors

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