Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy
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Ohio University / OhioLINK
2011
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| Online Access: | http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227 |
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ndltd-OhioLink-oai-etd.ohiolink.edu-ohiou13032632272021-08-03T05:47:00Z Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy Ramani, Jayanth Materials Science Physics reflectance spectroscopy semiconductor charaterisation III-V semiconductors photoreflectance spectroscopy The last decade has seen the semiconductor industry achieve giant leaps. The III-V semiconductors including the III-nitride materials have turned out to be one of the most exciting semiconductor compounds for the realization of modern day optoelectronic devices. Prior to using these semiconductors in the realization of optoelectronic devices it is necessary to characterize them for their structural, electrical and optical properties. Reflectance spectroscopy is one of the most reliable and accurate semiconductor characterization technique which could be used for both thin films and bulk semiconductors in quest for gaining knowledge about materials opto-electrical parameters. The ability to produce sharp features indirectly representing semiconductor physical parameters like band gap, broadening parameter, defect levels etc. at given temperature is one of greatest advantage of this technique. Here, we study the reflectedlight from the specimen rather than the luminescence. The thesis presented will review this in detail along with the description of the experimental setup developed for the purpose of studying III-V and RE doped III-nitride semiconductors using photoreflectance spectroscopy. Furthermore, selected experimental results obtained for GaAs and GaN doped with Tb3+ demonstrate increased sensitivity of the double modulation photoreflectance spectroscopy as compared to single modulation photoreflectance spectroscopy when conducted at room temperature. The thesis presented will review this in details. 2011-07-26 English text Ohio University / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227 http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws. |
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NDLTD |
| language |
English |
| sources |
NDLTD |
| topic |
Materials Science Physics reflectance spectroscopy semiconductor charaterisation III-V semiconductors photoreflectance spectroscopy |
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Materials Science Physics reflectance spectroscopy semiconductor charaterisation III-V semiconductors photoreflectance spectroscopy Ramani, Jayanth Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy |
| author |
Ramani, Jayanth |
| author_facet |
Ramani, Jayanth |
| author_sort |
Ramani, Jayanth |
| title |
Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy |
| title_short |
Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy |
| title_full |
Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy |
| title_fullStr |
Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy |
| title_full_unstemmed |
Development and Testing of the Experimental Setup for Characterization of Semiconductors Using Reflectance Spectroscopy |
| title_sort |
development and testing of the experimental setup for characterization of semiconductors using reflectance spectroscopy |
| publisher |
Ohio University / OhioLINK |
| publishDate |
2011 |
| url |
http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1303263227 |
| work_keys_str_mv |
AT ramanijayanth developmentandtestingoftheexperimentalsetupforcharacterizationofsemiconductorsusingreflectancespectroscopy |
| _version_ |
1719425176923275264 |