Mixed-signal testing of integrated analog circuits and modules

Mixed-signal testing of integrated analog circuits and modules

Bibliographic Details
Main Author:	Liu, Zhi-Hong
Language:	English
Published:	Ohio University / OhioLINK 1999
Subjects:	component verification statistical fault detection optimum test point selection In-Circuit Test (ICT) End-Of- Line Test
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1181174339

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