Impact of Repetitive Short Circuit Transients on the Conducted Electromagnetic Interference of SiC and Si Based Power Devices

Impact of Repetitive Short Circuit Transients on the Conducted Electromagnetic Interference of SiC and Si Based Power Devices

Bibliographic Details
Main Author:	Siraj, Ahmed Shahnewaz
Language:	English
Published:	Miami University / OhioLINK 2021
Subjects:	Engineering Power electronics EMI PHM SiC repetitive short circuit Si IGBT semiconductor reliability device degradation
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=miami1622056294414037

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