Depth profile determination of stratified layers using internal reflection spectroscopy

Bibliographic Details
Main Author:	Shick, Robert Adam
Language:	English
Published:	Case Western Reserve University School of Graduate Studies / OhioLINK 1993
Subjects:	Plastics Technology Depth profile information Internal reflection spectroscopy
Online Access:	http://rave.ohiolink.edu/etdc/view?acc_num=case1060700279

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spelling	ndltd-OhioLink-oai-etd.ohiolink.edu-case10607002792021-08-03T05:31:41Z Depth profile determination of stratified layers using internal reflection spectroscopy Shick, Robert Adam Plastics Technology Depth profile information Internal reflection spectroscopy It is the purpose of this project to develop a method to quantitatively determine depth profile information using internal reflection spectroscopy. The theory allowing depth profile information to be recovered from variable angle attenuated total reflection (VA-ATR) spectroscopy is shown for both perpendicular and parallel polarization. The major approximation is that the extinction coefficient must be small, so that the field decay due to distance and absorption are comparable. The errors invoked by these approximations are evaluated by comparison with exact optical simulations using dispersion theory. Having shown that the newly developed method is theoretically feasible, it is important to show that it is a viable technique with current instrumentation. It is shown that VA-ATR Fourier transform infrared spectroscopy is a valuable technique to recover depth profile information on the molecular level. A number of known step profiles are measured to determine the limits of applicability for this method. Thickness results obtained using the internal reflection technique are compared with thickness determination using a stylus profilometer. It is shown that the results using p-polarization are somewhat more realistic than s-polarization. The VA-ATR infrared technique was used to investigate the interaction and diffusion of poly(2,6-dimethyl-1,4-phenylene oxide), PPO, and polystyrene, PS. Optical theory was employed to clarify the effect of the local interactions on the infrared spectra. Optical theory was also used to determine composition profiles at various times of inter-diffusion. It was observed that migration occurred between the PPO and the PS layer, even below the glass transition of the PPO. This migration proceeded linearly with time<sup>1/2</sup> which is an indication of Fickian diffusion, although the profiles had some additional non-Fickian characteristics 1993 English text Case Western Reserve University School of Graduate Studies / OhioLINK http://rave.ohiolink.edu/etdc/view?acc_num=case1060700279 http://rave.ohiolink.edu/etdc/view?acc_num=case1060700279 unrestricted This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.
collection	NDLTD
language	English
sources	NDLTD
topic	Plastics Technology Depth profile information Internal reflection spectroscopy
spellingShingle	Plastics Technology Depth profile information Internal reflection spectroscopy Shick, Robert Adam Depth profile determination of stratified layers using internal reflection spectroscopy
author	Shick, Robert Adam
author_facet	Shick, Robert Adam
author_sort	Shick, Robert Adam
title	Depth profile determination of stratified layers using internal reflection spectroscopy
title_short	Depth profile determination of stratified layers using internal reflection spectroscopy
title_full	Depth profile determination of stratified layers using internal reflection spectroscopy
title_fullStr	Depth profile determination of stratified layers using internal reflection spectroscopy
title_full_unstemmed	Depth profile determination of stratified layers using internal reflection spectroscopy
title_sort	depth profile determination of stratified layers using internal reflection spectroscopy
publisher	Case Western Reserve University School of Graduate Studies / OhioLINK
publishDate	1993
url	http://rave.ohiolink.edu/etdc/view?acc_num=case1060700279
work_keys_str_mv	AT shickrobertadam depthprofiledeterminationofstratifiedlayersusinginternalreflectionspectroscopy
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Depth profile determination of stratified layers using internal reflection spectroscopy

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