Direct measurement of graphene adhesion on silicon surface by intercalation of nanoparticles
We report a technique to characterize adhesion of monolayered/multilayered graphene sheets on silicon wafer. Nanoparticles trapped at graphene-silicon interface act as point wedges to support axisymmetric blisters. Local adhesion strength is found by measuring the particle height and blister radius...
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| Online Access: | http://hdl.handle.net/2047/d20000965 |