| Summary: | Highly oriented films of BaFe<sub>1</sub><sub>2</sub>O<sub>1</sub><sub>9</sub> have been deposited onto MgO (111) substrates by pulsed laser ablation deposition. In contrast to epitaxial BaFe<sub>1</sub><sub>2</sub>O<sub>1</sub><sub>9</sub> films grown on Al<sub>2</sub>O<sub>3</sub> (001) substrates, these films experience an in-plane biaxial compressive stress, and do not crack or delaminate to thicknesses of at least 28 μm. X-ray diffraction, magnetometry, torque magnetometry, and ferrimagnetic resonance results all indicate excellent c-axis orientation normal to the film plane, and magnetic properties comparable to bulk values. The thickness and properties of these films approach those required for applications in low-loss self-biased nonreciprocal microwave devices
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