Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis

Bibliographic Details
Main Authors: Kato, T., Suzuoki, Y.
Language:en
Published: IEEE 2007
Online Access:http://dx.doi.org/10.1109/ICSD.2007.4290785
http://hdl.handle.net/2237/9426
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spelling ndltd-NAGOYA-oai-ir.nul.nagoya-u.ac.jp-2237-94262013-09-03T03:16:22ZRobustness Assessment of Life-Cycle-Management of CV Cables based on Degradation DiagnosisKato, T.Suzuoki, Y.IEEE2007Article(publisher)http://dx.doi.org/10.1109/ICSD.2007.4290785http://hdl.handle.net/2237/9426IEEE International Conference on Solid Dielectrics. 2007, p.192-195enCopyright © 2007 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.
collection NDLTD
language en
sources NDLTD
author Kato, T.
Suzuoki, Y.
spellingShingle Kato, T.
Suzuoki, Y.
Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis
author_facet Kato, T.
Suzuoki, Y.
author_sort Kato, T.
title Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis
title_short Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis
title_full Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis
title_fullStr Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis
title_full_unstemmed Robustness Assessment of Life-Cycle-Management of CV Cables based on Degradation Diagnosis
title_sort robustness assessment of life-cycle-management of cv cables based on degradation diagnosis
publisher IEEE
publishDate 2007
url http://dx.doi.org/10.1109/ICSD.2007.4290785
http://hdl.handle.net/2237/9426
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