Half-life and internal conversion electron measurements in low-lying levels of 125, 127 Ba
Main Authors: | Shibata, M., Iimura, H., Asai, M., Osa, A., Kawade, K., Ichikawa, S., Oshima, M., Sekine, T., Shinohara, N. |
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Language: | en |
Published: |
American Physical Society
2002
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Online Access: | http://dx.doi.org/10.1103/PhysRevC.65.024305 http://hdl.handle.net/2237/7404 |
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