Half-life and internal conversion electron measurements in low-lying levels of 125, 127 Ba

Bibliographic Details
Main Authors: Shibata, M., Iimura, H., Asai, M., Osa, A., Kawade, K., Ichikawa, S., Oshima, M., Sekine, T., Shinohara, N.
Language:en
Published: American Physical Society 2002
Online Access:http://dx.doi.org/10.1103/PhysRevC.65.024305
http://hdl.handle.net/2237/7404

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