Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility

Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001. === Includes bibliographical references (p. 71). === by David Charles Knudsen. === S.M.

Bibliographic Details
Main Author: Knudsen, David Charles, 1972-
Other Authors: Roy Welsch and Kevin Amaratunga.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2014
Subjects:
Online Access:http://hdl.handle.net/1721.1/84228

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