Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001. === Includes bibliographical references (p. 71). === by David Charles Knudsen. === S.M.
Main Author: | Knudsen, David Charles, 1972- |
---|---|
Other Authors: | Roy Welsch and Kevin Amaratunga. |
Format: | Others |
Language: | English |
Published: |
Massachusetts Institute of Technology
2014
|
Subjects: | |
Online Access: | http://hdl.handle.net/1721.1/84228 |
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