Improved high-resolution seismic profiling.

Improved high-resolution seismic profiling.

Massachusetts Institute of Technology. Dept. of Geology and Geophysics. Thesis. 1966. M.S. === Bibliography: leaf 43. === M.S.

Bibliographic Details
Main Author: Krotser, Donald Jay
Other Authors: Lee Wallace Dean, III.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2010
Subjects:
Geology and Geophysics
Online Access:http://hdl.handle.net/1721.1/59609

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